Software Reliability Growth Model with Logistic Testing-effort Function Considering Log-logistic Testing-effort and Imperfect Debugging

SOFTWARE RELIABILITY GROWTH MODEL WITH LOGISTIC TESTING-EFFORT FUNCTION CONSIDERING LOG-LOGISTIC TESTING-EFFORT AND IMPERFECT DEBUGGING O. Naga Raju1 and Ch. Satyanaraya2 1Department of Computer Science & Engineering, Acharya Nagarjuna University, A.P., India. 2Department of Computer Science & Engineering, JNT University, Kakinda, India. E-mail: [email protected] In this paper, we investigate a Software Reliability Growth Model (SRGM) based on the Non Homogeneous Poisson Process (NHPP) which incorporates a logistic testing-effort function. We present Software Reliability Growth Model (SRGM) based on non-homogeneous Poisson process (NHPP), which incorporates the amount of testing effort consumptions during software testing phase. The time dependent behavior of testing effort consumptions is described by Log-Logistic curve. [1] Has used this model into SRGM for finite failure NHPP. In this paper, we will show that a Log-Logistic Test-Effort Function (TEF) can be expressed as a Software Development/test-effort curve. It is assume that the error detection rate to the amount of testing-effort spent during the testing phase is proportional to the current error content. The SRGM parameters are estimated by least square estimation (LSE) and Maximum likelihood Estimation (MLE) methods. The method of data analysis for software reliability measurements are presented for three real data set and results are compared with other existing models to show that the proposed model is good enough to give more accurate description of resources consumption give better fit.